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| AOS Semiconductor Product Reliability Report AOZ8005CI, rev 1 Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com Mar 26, 2007 1 This AOS product reliability report summarizes the qualification result for AOZ8005CI. Review of the electrical test results confirm that AOZ8005CI pass AOS quality and reliability requirements for product release. The continuous qualification testing and reliability monitoring program ensure that all outgoing products will continue to meet AOS quality and reliability standards. Table of Contents: I. II. III. IV. V. Product Description Package and Die information Qualification Test Requirements Qualification Tests Result Quality Assurance Information I. Product Description: The AOZ8005CI is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. The product comes in RoHS compliant, SOT-23 package and is rated over a -40C to +85C ambient temperature range. . Absolute Maximum Ratings Parameter VP-VN 6V Peak Pulse Current (Ipp), tp=8/20uS 5A Peak Power Dissipation (8x20mS@ 25C) SOT-23 TBD Storage Temperature (TS) ESD Rating per IEC61000-4-2, contact (1) ESD Rating per IEC61000-4-2, air (2) ESD Rating per Human Body Model (2) Junction Temperature (Tj) -65C to +150C 12kV 15kV 15kV -40C to +125C Notes: (1) IEC-61000-4-2 discharge with CDischarge=150pF, RDischarge=330 (2) Human Body Discharge per MIL-STD-883, Method 3015 CDischarge=100pF, RDischarge=1.5k II. Package and Die Information: Product ID Process Package Type Die L/F material Die attach material Die bond wire Mold Material Plating Material AOZ8005CI UMC 0.5um 5/18V 2P3M process SOT-23 UE003A3 (size: 716 x 616 um) Copper A194FH 84-3J epoxy Au, 1mil MP8005CIH4 Pure Tin 2 III. Qualification Tests Requirments * * 2 lots of AOZ8005CI up to 168 hrs of B/I for New Product release. 2 lots of package qual testing (PCT, 250 cycles TC) for SOT-23 for package release to manufacturing. IV. Qualification Tests Result Test Item PreConditioning Test Condition Per JESD 22-A113 0 85 C /85%RH, 3 cyc 0 reflow@260 C Sample Size 2 lot (82 /lot) Result pass Comment Pkg. Qual by extension using AOZ8000C. Lot 1 (wafer lot# F162T.51-20, marking: A02), 82 units, passed pre-conditioning. Lot 2 (wafer lot# F162T.51-20, marking: A03), 82 units, passed pre-conditioning. Pkg. Qual by extension using AOZ8000C. Lot 1 (wafer lot# F162T.51-20, marking: A02), 80 units, passed 500 hrs . Lot 2 (wafer lot# F162T.51-20, marking: A03), 80 units, passed 500 hrs . Lot 1 (wafer lot# FN2MT.01-12, marking: AC001), 80 units, passed 500 hrs . Lot 2 (wafer lot# FN646.03-4 marking: AC003), 80 units, passed 168 hrs . Pkg. Qual by extension using AOZ8000C. Lot 1 (wafer lot# F162T.51-20, marking: A02), 60 units, passed HAST 100 hrs . Lot 2 (wafer lot# F162T.51-20, marking: A03), 60 units, passed HAST 100 hrs . Pkg. Qual by extension using AOZ8000C. Lot 1 (wafer lot# F162T.51-20, marking: A02), 82 units, passed TC 500 cycles. Lot 2 (wafer lot# F162T.51-20, marking: A03), 82 units, passed TC 500 cycles. Pkg. Qual by extension using AOZ8000C. Lot 1 (wafer lot# F162T.51-20, marking: A02), 82 units, passed PCT 96 hrs. Lot 2 (wafer lot# F162T.51-20, marking: A03), 82 units, passed PCT 96 hrs. Lot 1 (wafer lot# FN646.03-4 , marking: AC003 ), 3 units passed 12kV Lot 1 (wafer lot# FN646.03-4 , marking: AC003 ), 3 units passed 15kV Lot 1 (wafer lot# FN646.03-4 , marking: AC003 ), 3 units passed Latch-up. HTOL (pkg qual burn-in ) Per JESD 22-A108_B Vdd=6V Temp = 125 0C 2 lot (80 /lot) pass HTOL (new UI_EPI process) HAST Per JESD 22-A108_B Vdd=6V Temp = 125 0C 2 lot (80 /lot) pass '130 +/- 2 0C, 85%RH, 33.3 2 lot (60 /lot) psi, at VCC min power dissapation pass Temperature Cycle '-65 0C to +150 0C, air to air (2cyc/hr) 2 lot (82 /lot) pass Pressure Pot 121C, 15+/-1 PSIG, RH= 100% 2 lot (82 /lot) pass ESD Rating ESD Rating Latch-up Per IEC-61000-4-2, contact Per IEC-61000-4-2, air Per JESD78A 3 units 3 units 3 units pass pass pass The qualification test results confirm that AOZ8005CI pass AOS quality and reliability requirements for product release. 3 V. Quality Assurance Information Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed Outgoing Defect Rate: < 50 ppm Quality Sample Plan: conform to Mil-Std -105D 4 |
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